)]}'
{
  "commit": "5a2d5694237b9048c622232f1a6ab445213b465c",
  "tree": "2cbaffa0f025a7ccfd9fee403b19e04a439f76ee",
  "parents": [
    "50ee9acf3cc118ceba7269bce8e915067f4e68bf"
  ],
  "author": {
    "name": "Rachit Shrivastava",
    "email": "rachit.shrivastava@nokia.com",
    "time": "Mon Jul 17 10:29:20 2017 -0400"
  },
  "committer": {
    "name": "khenaidoo Nursimulu",
    "email": "knursimu@ciena.com",
    "time": "Tue Jul 18 13:07:17 2017 -0700"
  },
  "message": "VOL-271: Support itests and utests for WT-385 xPON objects\n\nitests support for the configuration of following WT-385 objects\n - v_ont_ani\n - ont_ani\n - v_enet\n\nCode optimization for the test cases\nREADME.md is updated to reflect the itests\n\nChange-Id: I0a93be85a50ad4c18d005b1402ffd7da9cc2f71a\n",
  "tree_diff": [
    {
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      "old_mode": 33188,
      "old_path": "tests/itests/README.md",
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      "new_mode": 33188,
      "new_path": "tests/itests/README.md"
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      "old_path": "tests/itests/voltha/test_voltha_xpon.py",
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      "new_path": "tests/itests/voltha/test_voltha_xpon.py"
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}